Re: DM: Association

 > Does anybody know about KDD application to flaws recognition, analisys and
 > so on?
 > ============================
 > Bogdan CRANGANU-CRETU, Ph.D.
 > Advanced System Evaluation Laboratory,
 > Institute of Fluid Science,
 > Tohoku University,
 > 2-1-1 Katahira, Aoba-ku, Sendai
 > 908-8577, Japan
 > E-mail: bogdan@ohm.tohoku.ac.jp
 > Tel.: 022-217-5291
 > ==============================

We have quite a bit of experience with the use of both CART(r) and MARS(tm) in
industrial process quality control.  MARS in particular is in extensive use in
the semiconductor industry and we expect a success story to appear soon in a
trade journal.

We also have a Japanese language book on the topic which recently won the 1999
Nikkei QC Literature Prize; a link to Japanese publisher can be found on
http://www.salford-systems.com/products-cart.html.


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• References:
  • Re: DM: Association
    • From: Bogdan CRANGANU-CRETU

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